A Multi-dimensional Iddq Testing Method Using Mahalanobis Distance

Iddq testing has been widely used to complement the fault coverage of functional testing. However, continual manufacturing process advances changed the situations. Even though delta-Iddq and many enhanced Iddq testing methods have been proposed in recent years, it is still difficult to identify the faulty chips from variations of good chips by simple one-dimensional analysis. In this paper, we propose Iddq testing using multi-dimensional analysis by using Mahalanobis distance to identify functional faulty product, and we evaluate our method by product data of over 100,000 chips.