The characterization of CdTe TimePix device and the study of its capabilities for the double beta decay measurements

This work aims at the characterization of cadmium-telluride detector bump-bonded on the TimePix readout chip and the evaluation of its potential as a tool to study the double beta decay (ββ) processes (such as β
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β
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or EC/EC), typically performed in ultra low background conditions. First tests with the CdTe pixelated sensor (256x256 pixel matrix, 55μ, m pitch, 1mm sensor thickness) have been performed. The results of the device calibration and testing of the spectroscopic properties as well as the estimation of intrinsic background of the device are presented.