Abstract:
This paper presents a new and comprehensive power-aware test scheme compatible with a test compression environment. The key contribution of the paper is a flexible test a...Show MoreMetadata
Abstract:
This paper presents a new and comprehensive power-aware test scheme compatible with a test compression environment. The key contribution of the paper is a flexible test application framework that achieves significant reductions in switching activity during all phases of scan test: scan loading, unloading, and capture.
Published in: 2008 IEEE International Test Conference
Date of Conference: 28-30 October 2008
Date Added to IEEE Xplore: 08 December 2008
ISBN Information: