Array codes for clustered column erasures

A new error model is proposed for codes over channels with memory. According to this error model, both the number of symbol errors and the number of error clusters are used to characterize permissible errors. Considering this model as a generalization of random erasures in array codes naturally captures the properties of high-order failure events in disk arrays. A new family of codes tailored to such a model is shown to provide significant complexity improvements compared to known array codes.