Analysis of mechanical and electrical straining effects on TFRs — statistical bimodal conductance approach

In this paper statistical approach to analysis of mechanically and electrically strained TFRs will be presented using parameters from deterministic model. Noise performances of stained resistors will be explained using redistribution of numbers of contacts and MIM cells as well as adequate contributions of noise due to metallic conduction and noise due to fluctuations in MIM cells to total noise of strained resistor.