A Novel ATPG Framework to Detect Weight Related Defects in Threshold Logic Gates

The gate that is implemented with threshold logic is called a threshold logic gate (TLG). The logic output value of an TLG depends on the weighted sum of its inputs. Manufactured weights in the threshold logic gates (TLGs) may differ from the designed values and significantly affects the fault coverage. A novel automatic test pattern generation (ATPG) tool is proposed to detect whether the circuit is malfunctioning due to such weight-related defects.