A Test Data Compression Method for System-on-a-Chip

This paper presents a novel and efficient code, named MFDR(Modified Frequency-Directed Run-length), for test data compression. The proposed code is a class of variable-to-variable-length prefix code. Both theoretical analysis and experimental results indicate that when the probability of 0s in the test set is greater than 0.8565, it can acquire better compression efficiency than FDR code, and compared to Hybrid Run-length code, the point is 0.8794.