Dielectric Relaxation Behavior of PEEK during the Loss of the Coolant Accident

Dielectric relaxation behavior of poly(etheretherketone) (PEEK) during the loss of coolant accident (LOCA) was investigated. The result of the temperature dependency of the dielectric properties indicated that the glass transition temperature of the aged PEEK increased as increasing radiation doses and thermal ageing time. The relaxation intensity calculated using Cole-Cole's circular arc could be useful for the evaluation of the PEEK degradation.