Parallelized Full Package Signal Integrity Analysis Using Spatially Distributed 3D Circuit Models

Full package signal integrity analysis is parallelized in a suite of tools called PATS (package analysis tool suite). PATS extracts sparse circuit models using a segment-to-segment BEM (boundary element method) algorithm for both capacitance and inverse inductance and uses a fixed-time step circuit simulator to create time-domain scattering models. Critical issues regarding the parallelization of PATS and segment-to-segment BEM circuit models are explored. Examples demonstrating the accuracy of this approach are presented for real packaging cases