I. Introduction
Third-Generation synchrotron sources provide X-ray beam sizes in nanometric size. Devices required for beam monitoring have specifications that may vary from a simple requirement of intermittent verification that the beam has not drifted outside some acceptable position limit, to the need for continuous measurements in the case where a motorized stage is required to stabilize the beam position. The X-ray beams at the third synchrotron sources are intense: after passing through a crystal monochromator, the beam (energy typically between 5 and 50 keV) will contain and will be focused to a spot size from 80 nm to 50 microns depending on the application. A permanent transmissive beam monitor is itself an optical element, and its impact on the beam quality must be tolerable. At the physical device level, pink/white beam monitoring also presents qualitatively different technical problems as compared to the monochromatic beam case, notably due to the higher beam intensity and the consequent heat load from beam absorption. The present development was foreseen for monochromatic beam at a typical energy of 14 keV. Various devices are currently in use at the ESRF for monochromatic beam intensity and position monitoring, each with their merits and drawbacks.