Probabilistic Evaluation of Analog Single Event Transients

We propose a procedure to estimate the consequences of an analog single event transient (ASET). The method qualifies ASETs based on their frequency domain signatures and determines the probability of a single event transient induced error.

I. Introduction

Analog Single Event Transients (ASETs) lead to an assortment of output signal signatures and surrounding system responses. These transients are an important issue for analog circuit systems that are exposed to ionizing radiation [1]. However, the radiation effects community has not agreed upon a figure of merit for ASET induced errors. A method is needed to evaluate the consequences of any single event transient (SET) on surrounding circuitry.