Thermally Stimulated Current Measurement of Traps in Detector-Grade CdTe

Thermally stimulated current (TSC) has been measured in γ detector-grade, high resistivity CdTe:In and CdTe:In,Cl. Electron mobility-trapping time products, μτ+, measured at room temperature correlate strongly with the shape and magnitude of a prominent TSC band observed at 40 K. This correlation is used as the basis for a simple method of selecting samples appropriate for detector applications.