Analysis of Magnetic Domain Patterns and Vector Hysteresis Loops in Dot/Antidot Structures

Dot and antidot structures have been prepared by means of optical lithography on Co-Fe-Si-B and permalloy thin films with thickness of 100 nm and 50 nm respectively. Magnetic force microscopy has been employed to study their surface magnetization configuration. Vector vibrating sample magnetometry has been exploited to measure hysteresis loops with the application of an in-plane magnetic field directed at different angles with respect to the dot/antidot arrays. Depending on microstructure geometry and chosen material, different and complex domain structures have been observed and discussed with the support of vector magnetization measurements.