A study of noise effects due to the diode protection for shield resistance measurement of GMR recording heads

This paper examines the noise effects of protection diodes used for preventing voltage breakdown during magnetoresistive (MR)-shield resistance measurement in quasi-static test (QST) for giant magnetoresistive heads (GMR). Two forms of diode protection will be presented and the noise behavior of them will be discussed and compared in the context of the GMR Noise test.