Analysis of side writing asymmetry

The side writing asymmetry of a recording head was investigated using an overwrite configuration that enhances the edge effects. The track profiles of the overwrite patterns were measured for analyzing the side writing performance of the head. Magnetic force microscope (MFM) images of the overwrite patterns were studied using fast Fourier transforms (FFT), and they confirmed the profiling results. We measured weak edge effects at good pole alignment. The experiments were performed with metal evaporated (ME) and metal particle (MP) tapes having magnetic layers between 50 and 300 nm.