Automatic image processing with submicron resolution

A single board image digitizer system hosted in an IBM-AT has been added to a high speed optical sampling microscope system to enhance its performance. Software for controlling the image digitizer and processing the digitized images through the IBM-AT has been implemented. With such a system, a domain wall boundary position can be measured within 0.05μm precision. Stripe domain transient response showing spatial nonuniformity in the first 0.1μm of motion is presented.