Identification of parameters in multilayer media

Multilayer media are of increasing importance as magneto-optic and perpendicular media. The properties of successive layers evolve as the layers are epitaxially deposited. This complicates both the model for these media and the identification of the model parameters. In this paper, the effect of the variation of the Preisach model parameters is discussed and an identification procedure is outlined. Reentrant-type hysteresis behavior, which is found to be necessary in order to accurately fit both major loop and first-order reversal curves in these multilayer materials, is also considered.