I. Introduction and Motivation
Reliability block diagramming (RBD) has been an active area of research for decades, even more so now with the advent of the embedded systems [1]–[11]. This paper explores to describe and compute the reliability in such (embedded) systems through an RBD approach. It is assumed that the input data required, such as reliability or availability including the aspect of security for each component and link in the RBD approach, is correctly facilitated by improving the very large scale integration (VLSI) testing techniques [24]–[30]. Earlier, simple or complicated series–parallel systems are studied to demonstrate that these networks can be encoded using a modified Polish notation employing postfixes [12], [17], [19]–[22]. The “compression” algorithm through a user-friendly and graphical Java application computes the reliability of any series–parallel network, no matter how large or complicated it is. Furthermore, the encoded topology can be transmitted remotely and then reverse-coded to reconstruct the original network diagram for purposes of securing classified information and saving space, a project which is also in progress nearing completion.