Characterization of Andreev reflection barriers by low frequency noise spectroscopy in all-thin-film superconducting point contacts

Low-frequency noise properties of all-thin-film superconducting point contacts have been investigated. Device characterization is also reported here. The quasi particle behavior is well explained by the Andreev reflection. The low-frequency noise spectral density scaled by frequency and normal resistance is studied as a function of junction (contact) resistance.<
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