Critical currents, proximity effect, and Josephson penetration depth in planar high-T/sub c/ Josephson junctions

We have studied the temperature dependence of the critical current in planar high-T/sub c/ Josephson junctions fabricated in YBa/sub 2/Cu/sub 3/O/sub 7/ thin films by focused electron irradiation. We show that in the range of critical current densities spanning more than five orders of magnitude and temperature range 0.1