Coercivity and frequency dependence of track widths and erase bands in thin film media

To understand the data track width, erase bands and the total write width as a function of coercivity and frequency in thin film media, a systematic study was conducted based on triple track profile (TPF) technique using pseudo random sequences (PRS TPF). Frequency harmonics of PRS up to 200 kfci were analyzed to reveal the frequency dependence of the track edge effects. Thin film disks used in this study have coercivities from 1766 Oe to 2878 Oe. Single frequency recording (SF TPF) and MFM (magnetic force microscopy) were utilized for comparison. Regardless of the nonlinear track edge effects, PRS TPF and SF TPF show good correlation over a wide coercivity and frequency range.