Abstract:
The simultaneous switching noise of off-chip drivers and internal circuits affect the performance of the CMOS chips. These effects are quantified using voltage waveforms ...Show MoreMetadata
Abstract:
The simultaneous switching noise of off-chip drivers and internal circuits affect the performance of the CMOS chips. These effects are quantified using voltage waveforms obtained from simulations on a high-frequency package model.
Date of Conference: 02-04 October 1995
Date Added to IEEE Xplore: 06 August 2002
Print ISBN:0-7803-3034-X